| R. Beck < R. Berjoan < R. Bertini | Facettes : |
List of bibliographic references
Number of relevant bibliographic references: 3.| Ident. | Authors (with country if any) | Title |
|---|---|---|
| 000121 (1998) | C. Meunier [France] ; C. Monteil [France] ; C. Savall [France] ; F. Palmino [France] ; J. Weber [Suisse] ; R. Berjoan [France] ; J. Durand [France] | RBS-ERDA, XPS and XRD characterizations of PECVD tungsten nitride films |
| 000207 (1994) | C. Monteil [France] ; J. Durand [France] ; R. Berjoan [France] ; B. Cros [France] ; J. P. Martinez [France] | AES and HRTEM study of an a‐SiNx: H/W/WSix/a‐SiNx: H multilayer structure realized by PEVCD |
| 000228 (1992) | J. L. Leclercq [France] ; J. Durand [France] ; L. Cot [France] ; R. Berjoan [France] ; C. Dupuy [France] | Plasma-enhanced chemical vapor deposition of phosphorus nitride thin films: Auger spectroscopy characterization |
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